RocketMonkey
Active Member
I was going to say submerge the whole rig...
I was going to say submerge the whole rig...
I think my setup is more complete, I mainly test for quiescent current which is 100mA per device, that's the biggest heat generator. My setup test 60 device at a time.
The problem is not about measuring the Vbe, the hard part is when you heat the transistors, the Vbe keep changing. YOu cannot mount the transistors onto a heatsink ( you have 60 of them and they have to be swap easily!!!). Also, For the current you have to be careful the socket contact resistance. The way the article using switches and all will introduce error as we are matching to 1mV. I don't even measure on the fixture, I measure directly at the emitter of each transistor.
I literally do a quick read, then swap transistor to group them. Retest, swap until I get a set of 11 at close match. Let it rest to cool everything down. Then retest to verify. It's the tempco that is the main problem, not the test fixture design.
I am just anal, If I get into it, I try to go all the way. I guess I failed. Ha ha, I am retired, I have time!!!
It is more forgiving in my case using 0.27ohm emitter resistors. Doug Self advocates using 0.1ohm emitter resistors and run about 250mA per output pairs. That becomes very critical if you have 4mV difference in Vbe between adjacent transistors. On the side note, do you know Bob Cordell and Doug Self got into quite a hot debate in running such high current and using such low value emitter resistors?